Transient DOS while parsing the EPTM test control message to get the test pattern.
Metrics
Affected Vendors & Products
References
History
Thu, 25 Sep 2025 08:30:00 +0000
Type | Values Removed | Values Added |
---|---|---|
First Time appeared |
Qualcomm
Qualcomm snapdragon |
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Vendors & Products |
Qualcomm
Qualcomm snapdragon |
Wed, 24 Sep 2025 18:15:00 +0000
Type | Values Removed | Values Added |
---|---|---|
Metrics |
ssvc
|
Wed, 24 Sep 2025 15:45:00 +0000
Type | Values Removed | Values Added |
---|---|---|
Description | Transient DOS while parsing the EPTM test control message to get the test pattern. | |
Title | Buffer Over-read in BT Controller | |
Weaknesses | CWE-126 | |
References |
| |
Metrics |
cvssV3_1
|

Status: PUBLISHED
Assigner: qualcomm
Published:
Updated: 2025-09-24T17:28:16.793Z
Reserved: 2025-05-06T08:33:16.260Z
Link: CVE-2025-47318

Updated: 2025-09-24T17:28:14.030Z

Status : Awaiting Analysis
Published: 2025-09-24T16:15:37.100
Modified: 2025-09-24T18:11:24.520
Link: CVE-2025-47318

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